2005 International Conference on Solid State Devices and Materials
Sep 12 - Sep 15, 2005International Conference Center Kobe, Kobe, Japan
2005 International Conference on Solid State Devices and Materials
Sep 12 - Sep 15, 2005International Conference Center Kobe, Kobe, Japan
[B-2-1]Examination of the Universality of Hole Mobility in Strained-Si p-MOSFETs
Shinichi Takagi, Koji Takeda, Satoshi Sugahara, Toshinori Numata(1.Graduate School of Frontier Science, 2.School of Engineering, The Univ. of Tokyo, 3.MIRAI(ASET))
