2005 International Conference on Solid State Devices and Materials
Sep 12 - Sep 15, 2005International Conference Center Kobe, Kobe, Japan
2005 International Conference on Solid State Devices and Materials
Sep 12 - Sep 15, 2005International Conference Center Kobe, Kobe, Japan
[B-3-2]Si Substrate Orientation Induced Worse Hot Carrier Degradation in Novel (110)/<111’> Oriented Devices
Sinclair Chiang, M.F. Lu, Y.C. Liu, S. Huang-Lu, W.T. Shiau, S.C. Chien(1.Central Research and Development Division, UMC)
