2006 International Conference on Solid State Devices and Materials

2006 International Conference on Solid State Devices and Materials

Sep 12 - Sep 15, 2006PACIFICO Yokohama, Yokohama, Japan
International Conference on Solid State Devices and Materials
2006 International Conference on Solid State Devices and Materials

2006 International Conference on Solid State Devices and Materials

Sep 12 - Sep 15, 2006PACIFICO Yokohama, Yokohama, Japan

[A-1-4]Imaging of interference between incident and reflected electron waves at an InAs/GaSb heterointerface by low-temperature scanning tunneling spectroscopy

K. Suzuki, K. Kanisawa, S. Perraud, M. Ueki, K. Takashina, Y. Hirayama(1.NTT Basic Research Laboratories, NTT Corporation, 2.Laboratoire de Photonique et de Nanostructures, CNRS, 3.NTT Electronics Techno Corporation, 4.SORST-JST, 5.Graduate School of Science, 6.Tohoku University)
https://doi.org/10.7567/SSDM.2006.A-1-4