2006 International Conference on Solid State Devices and Materials
Sep 12 - Sep 15, 2006PACIFICO Yokohama, Yokohama, Japan
2006 International Conference on Solid State Devices and Materials
Sep 12 - Sep 15, 2006PACIFICO Yokohama, Yokohama, Japan
[A-6-5]Surface Potential Measurement of Carbon Nanotube FETs using Kelvin Probe Force Microscopy
T. Umesaka, H. Ohnaka, Y. Ohno, S. Kishimoto, K. Maezawa, T. Mizutani(1.Department of Quantum Engineering, Nagoya University, 2.PRESTO, Japan Science and Technology Agency, 3.Venture Business Laboratory, Nagoya University, 4.Institute of Advanced Research, Nagoya University)
