2006 International Conference on Solid State Devices and Materials
Sep 12 - Sep 15, 2006PACIFICO Yokohama, Yokohama, Japan
2006 International Conference on Solid State Devices and Materials
Sep 12 - Sep 15, 2006PACIFICO Yokohama, Yokohama, Japan
[A-8-4]Observation of single-electron pump operation with one ac gate bias in phosphorous-doped Si wires
D. Moraru, Y. Ono, H. Inokawa, K. Yokoi, R. Nuryadi, H. Ikeda, M. Tabe(1.Research Institute of Electronics, Shizuoka University, 2.NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation.)
