2007 International Conference on Solid State Devices and Materials
Sep 18 - Sep 21, 2007Tsukuba International Congress Center (EPOCHAL TSUKUBA), Ibaraki, Japan
2007 International Conference on Solid State Devices and Materials
Sep 18 - Sep 21, 2007Tsukuba International Congress Center (EPOCHAL TSUKUBA), Ibaraki, Japan
[A-2-1]Evaluation of SiO2/GeO2/Ge MIS Interface Properties by Low Temperature Conductance Method
Hiroshi Matsubara, Hiroshi Kumagai, Satoshi Sugahara, Mitsuru Takenaka, Shin-ichi Takagi(1.Graduate School of Frontier Science, The University of Tokyo, 2.Graduate School of Science and Technology, Tokyo Institute of Technology, 3.School of Engineering, The University of Tokyo)
