2009 International Conference on Solid State Devices and Materials
Oct 6 - Oct 9, 2009Sendai Kokusai Hotel, Miyagi, Japan
[A-3-1]Carbon Incorporation into Substitutional Silicon Site by Molecular Carbon Ion Implantation and Recrystallization Annealing for Stress Technique in nMOSFETs
H. Itokawa1, K. Miyano1, Y. Oshima1, I. Mizushima1, K. Suguro1(1.Toshiba Corp.)