2010 International Conference on Solid State Devices and Materials

2010 International Conference on Solid State Devices and Materials

Sep 21 - Sep 24, 2010The University of Tokyo, Tokyo, Japan
International Conference on Solid State Devices and Materials
2010 International Conference on Solid State Devices and Materials

2010 International Conference on Solid State Devices and Materials

Sep 21 - Sep 24, 2010The University of Tokyo, Tokyo, Japan

[A-7-2]Charge modulated reflectance measurement for probing carrier distribution in the pentacene field effect transistor

T. Manaka1, S. Kawashima1, Y. Tanaka1, M. Iwamoto1(1.Tokyo Tech , Japan)
https://doi.org/10.7567/SSDM.2010.A-7-2