International Conference on Solid State Devices and Materials
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2010 International Conference on Solid State Devices and Materials
Sep 21
- Sep 24, 2010
The University of Tokyo, Tokyo, Japan
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2010 International Conference on Solid State Devices and Materials
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2010 International Conference on Solid State Devices and Materials
Sep 21
- Sep 24, 2010
The University of Tokyo, Tokyo, Japan
[A-7-2]
Charge modulated reflectance measurement for probing carrier distribution in the pentacene field effect transistor
T. Manaka
1
, S. Kawashima
1
, Y. Tanaka
1
, M. Iwamoto
1
(1.Tokyo Tech , Japan)
https://doi.org/10.7567/SSDM.2010.A-7-2
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