2010 International Conference on Solid State Devices and Materials

2010 International Conference on Solid State Devices and Materials

Sep 21 - Sep 24, 2010The University of Tokyo, Tokyo, Japan
Back
International Conference on Solid State Devices and Materials
2010 International Conference on Solid State Devices and Materials

2010 International Conference on Solid State Devices and Materials

Sep 21 - Sep 24, 2010The University of Tokyo, Tokyo, Japan

[A-7-3]Bias-temperature-instability and thermal anneal effects of organic thin-film transistors

P. H. Chen1, P. Y. Lo1,2, T. S. Hu2, P. W. Li1(1.National Central Univ., 2.Indus. Tech. Res. Inst. , Taiwan)
https://doi.org/10.7567/SSDM.2010.A-7-3
Download PDFDownload PDF
Back