2012 International Conference on Solid State Devices and Materials
Sep 25 - Sep 27, 2012Kyoto International Conference Center, Kyoto, Japan
2012 International Conference on Solid State Devices and Materials
Sep 25 - Sep 27, 2012Kyoto International Conference Center, Kyoto, Japan
[B-2-5L]Exploring Trapped Charge Evolution in P-Channel SONOS Memory Device
F. H. Li1, Y. Y. Chiu1, Y. H. Lee1, R. W. Chang1, B. J. Yang1, W. T. Sun2, E. Lee2, C. W. Kuo2, R. Shirota1(1.National Chiao Tung Univ., 2.eMemory Tech. Inc. , Taiwan)
