International Conference on Solid State Devices and Materials
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2017 International Conference on Solid State Devices and Materials
Sep 19
- Sep 22, 2017
Sendai International Center
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2017 International Conference on Solid State Devices and Materials
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2017 International Conference on Solid State Devices and Materials
Sep 19
- Sep 22, 2017
Sendai International Center
[A-6-03]
In-situ
Observation of Cu Residuals in Resistance Switching Failure of MoO
x
/Al
2
O
3
CBRAM
○
M. Arita
1
, R. Ishikawa
1
, S. Hirata
1
, A. Turumaki-Fukuchi
1
, Y. Takahashi
1
(1.Hokkaido Univ. (Japan))
https://doi.org/10.7567/SSDM.2017.A-6-03
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