2017 International Conference on Solid State Devices and Materials
Sep 19 - Sep 22, 2017Sendai International Center
2017 International Conference on Solid State Devices and Materials
Sep 19 - Sep 22, 2017Sendai International Center
[B-2-05]Crystal Structure Analyses of Organic Semiconductor Thin Films with Variable-Temperature Two-Dimensional Grazing Incidence X-ray Diffraction
○R. Abe1, H. Kojima1, M. Kikuchi2, T. Watanabe3, T. Koganezawa3, N. Yoshimoto2, I. Hirosawa3, M. Nakamura1(1.NAIST (Japan), 2.Iwate Univ. (Japan), 3.Japan Synchrotron Radiation Research Institute (Japan))
