[M-1] Oxide Materials

2:30 PM - 3:00 PM JST(5:30 AM - 6:00 AM UTC)Invited

[M-1-01 (Invited)] Laser-Based Photoemission Electron Microscopy as a Nondestructive Imaging Tool for Ferroelectric Devices

〇Hirokazu Fujiwara¹ (1. The Univ. of Tokyo (Japan))

DOI:

https://doi.org/10.7567/SSDM.2024.M-1-01

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