The 23rd Symposium on Sensing via Image Information
Jun 7 - Jun 9, 2017PACIFICO Yokohama Annex Hall
The 23rd Symposium on Sensing via Image Information
Jun 7 - Jun 9, 2017PACIFICO Yokohama Annex Hall
[IS1-22]Local Distribution Model Matching for Robust Defect Registration in SHIBO Surfaces
*Sheng XIANG1, Shun'ichi KANEKO1, Hirokazu ASANO2(1. Hokkaido University, 2. HUAWEI TECHNOLOGIES JAPAN K.K.)
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