[19a-P08-1~9] 4 JSAP-Optica Joint Symposia 2024（ポスター）

英語発表

[19a-P08-9] Enhancing SERS Sensor Reliability with Intensity-Based Self-Referencing Using 4-Amino Thiophenol

〇(D)Arti Yadav¹, Sachin Kumar Srivastava^1,2 (1.Dept. of Physics, IIT Roorkee, 2.CPQCT, IIT Roorkee)

キーワード：

Surface enhanced Raman spectroscopy、Self-reference、Uniform SERS substrates

We improve the reliability of the SERS sensor by integrating intensity based self-referencing mechanism. The self-referenced mechanism was realized by sandwiching a monolayer of 4-Amino Thiophenol (4-ATP) between Ag nanoparticles and Ag nano-sculptured thin film (nSTF). The sensor performance is independent of the integration time of the detector. Intensity-based self-referencing mechanism proposes to resolve a long-lasting issue of SERS-based quantitative detection with high reliability. SERS sensor also possesses an excellent uniformity.