講演情報

[20a-A23-2]Easy Measurement of Phonon Dispersion at SPring-8

〇Alfred Q. R. BARON1,2, Daisuke ISHIKAWA1,2, Hiroshi FUKUI2,1, Taishun MANJO2,1 (1.Materials Dynamics Laboratory, RIKEN SPring-8 Center, 2.Precision Spectroscopy Division, SPring-8/JASRI)
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キーワード:

Phonon Dispersion、Lattice Dynamics、Atomic Motion

SPring-8, in Hyogo prefecture, has the world’s most advanced facilities for measuring phonons using x-rays. The spectrometers at the SPring-8 beamlines, BL35XU [1] and BL43LXU [2], provide world-leading flux in small beam sizes (from 0.005 to 0.1 mm) that can be used to investigate atomic dynamics on meV energy scales over ~nm to angstrom correlation lengths via inelastic x-ray scattering (IXS) (see [3] for a general introduction). These measurements are used to investigate many classes of materials, focusing on issues relevant to thermal transport, ferroelectricity, superconductivity, formation of charge density waves, phase transformations, localized phonon modes, interactions of phonons with magnons, etc. The instruments are also effective for investigating liquids, phonons in thin films, and elastic properties of materials in extreme (high-pressure and high temperature) conditions, even those approaching those of the Earth’s inner core – measurements that can be difficult or impossible by other methods.Perhaps most notably the samples for IXS can be small: a comfortable size sample is approx. 0.5 mm scale, but the method also has been used on approx. 0.005 mm samples, or even 0.0001 mm films. This makes it easy to investigate samples that are not available in the large (cubic-centimeter scale) needed by inelastic neutron scattering, the main competing technique.
The present talk will describe the main principle of operation of the meV-IXS spectrometers at SPring-8, discuss the variety of samples that may be investigated, and the range of available sample environments.

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