講演情報
[8p-E208-13]Thickness dependence of the low-frequency noise in W/Mn3Sn device induced by spin-orbit torque
〇(D)Wenwei LIANG1, Shoya Sakamoto1, Jieyi Chen1, Xiaoyu Piao1, Hidetoshi Kosaki1, Tomoya Higo3, Mihiro Asakura3, Motomi Aoki1, Satoru Nakatsuji1,2,3, Shinji Miwa1,2 (1.ISSP-UTokyo, 2.TSQS-UTokyo, 3.Dep. Phys. UTokyo)
キーワード：
Antiferromagnet、spin-orbit torque、Low-frequency noise
Antiferromagnetic spintronics has attracted significant attention due to the ability to control its magnetic structure electrically using spin-orbit torque. While the non-collinear spin structure of Mn3Sn has been controlled by spin-orbit torque, spin dynamics of the auto-oscillation, known as chiral spin rotation, has not been fully understood. Low frequency noise (LFN) measurement is useful to study chiral spin rotation in W/Mn3Sn devices, and specific 1/f and random telegraph noise related to the chiral spin rotation could be detected. In this study, we investigated the thickness dependence of the low-frequency noise and discussed it in detail.