講演情報
[TPI-005]Feasibility of an IEC‑based exposure index framework with X‑ray sensor‑integrated flat panel detector
Lia W. Izzati1, SeokJin Hwang1, Young-Jun Jung2, Yongsu Yoon1 (1.Department of Multidisciplinary Radiological Science, The Graduate School of Dongseo University, Republic of Korea, 2.LG Electronics, Republic of Korea)