1970 Conference on Solid State Devices

1970 Conference on Solid State Devices

1970年9月21日〜9月22日The Tokyo Chamber of Commerce and Industry, Tokyo, Japan
戻る
International Conference on Solid State Devices and Materials
1970 Conference on Solid State Devices

1970 Conference on Solid State Devices

1970年9月21日〜9月22日The Tokyo Chamber of Commerce and Industry, Tokyo, Japan

[2-5]Correlation of Image Defects with Crystal Defects in Silicon Vidicon

H. Shiraki、J. Matsui、T. Kawamura(1.Nippon Electric Co., Ltd.)
https://doi.org/10.7567/SSDM.1970.2-5
PDFダウンロードPDFダウンロード
戻る