1970 Conference on Solid State Devices

1970 Conference on Solid State Devices

1970年9月21日〜9月22日The Tokyo Chamber of Commerce and Industry, Tokyo, Japan
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International Conference on Solid State Devices and Materials
1970 Conference on Solid State Devices

1970 Conference on Solid State Devices

1970年9月21日〜9月22日The Tokyo Chamber of Commerce and Industry, Tokyo, Japan

[7-3]Determination of Intrinsic Response Times of Electrons and Holes from Avalanche Noise Measurements

I. M. Naqvi(1.Honeywell Inc.)
https://doi.org/10.7567/SSDM.1970.7-3
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