1972 Conference on Solid State Devices

1972 Conference on Solid State Devices

1972年8月30日〜8月31日The Tokyo Chamber of Commerce and Industry, Tokyo, Japan
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International Conference on Solid State Devices and Materials
1972 Conference on Solid State Devices

1972 Conference on Solid State Devices

1972年8月30日〜8月31日The Tokyo Chamber of Commerce and Industry, Tokyo, Japan

[3-2]A New Spectroscopic Method of Measuring Transient Temperature Distribution in High Power Thyristors

Junji Sakurai(1.Toshiba Research and Development Center, Tokyo Shibaura Electric Co., Ltd.)
https://doi.org/10.7567/SSDM.1972.3-2
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