1981 Conference on Solid State Devices

1981 Conference on Solid State Devices

1981年8月26日〜8月27日The Tokyo Chamber of Commerce and Industry, Tokyo, Japan
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International Conference on Solid State Devices and Materials
1981 Conference on Solid State Devices

1981 Conference on Solid State Devices

1981年8月26日〜8月27日The Tokyo Chamber of Commerce and Industry, Tokyo, Japan

[A-2-6]Soft Error Rate Analysis Model(SERAM) for Dynamic NMOS RAMs

Masaaki Aoki、Toru Toyabe、Takashi Shinoda、Toshiaki Masuhara、Shojiro Asai、Hiroshi Kawamoto、Kazumichi Mitsusada(1.Central Research Laboratory, Hitachi Ltd.、2.Device Development Center, Hitachi Ltd.)
https://doi.org/10.7567/SSDM.1981.A-2-6
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