[A-3-3]Lateral Epitaxy of Si Films Deposited in a UHV Ambient by Electron Beam Annealing
Tomoyasu Inoue、Kenji Shibata、Koichi Kato、Yuichi Mikata、Masahiro Kashiwagi(1.Toshiba Research and Development Center、2.Toshiba Semiconductor Device Engineering Laboratory、3.Toshiba Corporation)
