1990 International Conference on Solid State Devices and Materials
1990年8月22日〜8月24日Hotel Sendai Plaza, Sendai, Japan
[B-3-6]Improvement of GaAs MESFET's Characteristics on SiO2-Back-Coated Si Substrate by MOCVD
Takashi Egawa、Shinji Nozaki、Tetsuo Soga、Takashi Jimbo、Masayoshi Umeno(1.Department of Electrical and Computer Engineering、2.Nagoya Institute of Technology)