1993 International Conference on Solid State Devices and Materials

1993 International Conference on Solid State Devices and Materials

1993年8月29日〜9月1日Makuhari Messe, Chiba, Japan
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International Conference on Solid State Devices and Materials
1993 International Conference on Solid State Devices and Materials

1993 International Conference on Solid State Devices and Materials

1993年8月29日〜9月1日Makuhari Messe, Chiba, Japan

[A-2-5]Impact of Contact Resistance and Junction Capacitance on the Switching Performance in Scaled 0.1μm CMOS Devices

Satoshi Inaba、Tomohisa Mizuno、Masao Iwase、Hiromi Niiyama、Makoto Yoshimi、Akira Toriumi(1.ULSI Research Laboratories, R&D Center, Toshiba Corporation)
https://doi.org/10.7567/SSDM.1993.A-2-5
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