1993 International Conference on Solid State Devices and Materials

1993 International Conference on Solid State Devices and Materials

1993年8月29日〜9月1日Makuhari Messe, Chiba, Japan
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International Conference on Solid State Devices and Materials
1993 International Conference on Solid State Devices and Materials

1993 International Conference on Solid State Devices and Materials

1993年8月29日〜9月1日Makuhari Messe, Chiba, Japan

[A-2-6]Universal Behavior of Hot-Carrier Degradation in LDD NMOSFET's

J. S. Goo、H. Shin、H. Hwang、D. G. Kang、D. H. Ju(1.Research and Development Laboratory, GoldStar Electron Company, Ltd.)
https://doi.org/10.7567/SSDM.1993.A-2-6
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