1993 International Conference on Solid State Devices and Materials

1993 International Conference on Solid State Devices and Materials

1993年8月29日〜9月1日Makuhari Messe, Chiba, Japan
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International Conference on Solid State Devices and Materials
1993 International Conference on Solid State Devices and Materials

1993 International Conference on Solid State Devices and Materials

1993年8月29日〜9月1日Makuhari Messe, Chiba, Japan

[S-II-3]Hot-Carrier Related Phenomenon in MOSFETs with Furnace N2O-Nitrided Gate Oxides

G. W. Yoon、J. Ahn、G. Q. Lo、D. L. Kwong(1.Microelectronics Research Center The University of Texas at Austin)
https://doi.org/10.7567/SSDM.1993.S-II-3
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