2003 International Conference on Solid State Devices and Materials

2003 International Conference on Solid State Devices and Materials

2003年9月16日〜9月18日Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan
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International Conference on Solid State Devices and Materials
2003 International Conference on Solid State Devices and Materials

2003 International Conference on Solid State Devices and Materials

2003年9月16日〜9月18日Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan

[A-2-1]Enhancement of VTH Degradation under NBT Stress due to Hole Capturing

Yuichiro Mitani、Makoto Nagamine、Hideki Satake、A. Toriumi(1.Advanced LSI Technology Laboratory, Corporate R&D Center, Toshiba Corporation、2.Department of Materials Science, The University of Tokyo)
https://doi.org/10.7567/SSDM.2003.A-2-1
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