2003 International Conference on Solid State Devices and Materials
2003年9月16日〜9月18日Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan
2003 International Conference on Solid State Devices and Materials
2003年9月16日〜9月18日Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan
[A-2-2]New Mechanism for Negative-Bias-Temperature Instability and Its Impact on Scaling of pMOSFETs
Da-Yuan Lee、Horng-Chih Lin、Chi-Chun Chen、Chao-Hsin Chien、Tiao-Yuan Huang、Tahui Wang、Tze-Liang Lee、Shih-Chang Chen、Mong-Song Liang(1.Institute of Electronics, National Chiao-Tung University、2.National Nano Device Laboratories、3.Taiwan Semiconductor Manufacturing Company)
