2003 International Conference on Solid State Devices and Materials

2003 International Conference on Solid State Devices and Materials

2003年9月16日〜9月18日Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan
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International Conference on Solid State Devices and Materials
2003 International Conference on Solid State Devices and Materials

2003 International Conference on Solid State Devices and Materials

2003年9月16日〜9月18日Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan

[A-2-3]Origin of Enhanced Thermal Noise for 100nm-MOSFETs

S. Hosokawa、Y. Shiraga、H. Ueno、M. Miura-Mattausch、H.J. Mattausch、T. Ohguro、S. Kumashiro、M. Taguchi、H. Masuda、S. Miyamoto(1.Graduate School of Advanced Sciences of Matter、2.Research Center for Nanodevices and Systems, Hiroshima University、3.Semiconductor Technology Academic Research Center)
https://doi.org/10.7567/SSDM.2003.A-2-3
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