2003 International Conference on Solid State Devices and Materials

2003 International Conference on Solid State Devices and Materials

2003年9月16日〜9月18日Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan
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International Conference on Solid State Devices and Materials
2003 International Conference on Solid State Devices and Materials

2003 International Conference on Solid State Devices and Materials

2003年9月16日〜9月18日Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan

[A-8-2]Experimental Evidence of Gate-Induced Schottky Barrier Height Lowering due to Image Force in Gated Schottky Diodes

A. Kinoshita、K. Uchida、J. Koga(1.Advanced LSI Technology Laboratory, Toshiba Corp.)
https://doi.org/10.7567/SSDM.2003.A-8-2
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