2006 International Conference on Solid State Devices and Materials
2006年9月12日〜9月15日PACIFICO Yokohama, Yokohama, Japan
2006 International Conference on Solid State Devices and Materials
2006年9月12日〜9月15日PACIFICO Yokohama, Yokohama, Japan
[A-6-5]Surface Potential Measurement of Carbon Nanotube FETs using Kelvin Probe Force Microscopy
T. Umesaka、H. Ohnaka、Y. Ohno、S. Kishimoto、K. Maezawa、T. Mizutani(1.Department of Quantum Engineering, Nagoya University、2.PRESTO, Japan Science and Technology Agency、3.Venture Business Laboratory, Nagoya University、4.Institute of Advanced Research, Nagoya University)
