2006 International Conference on Solid State Devices and Materials

2006 International Conference on Solid State Devices and Materials

2006年9月12日〜9月15日PACIFICO Yokohama, Yokohama, Japan

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International Conference on Solid State Devices and Materials
2006 International Conference on Solid State Devices and Materials

2006 International Conference on Solid State Devices and Materials

2006年9月12日〜9月15日PACIFICO Yokohama, Yokohama, Japan

当該イベント内で検索します。

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検索結果(566)

[A-1-2]Infrared detection with silicon nano transistors

K. Nishiguchi、Y. Ono、A. Fujiwara、H. Yamaguchi、H. Inokawa、Y. Takahashi(1.NTT Basic Research Labs., NTT Corporation、2.Research Institute of Electronics、3.Graduate School of Information Science and Technology)

[A-1-3]High-Resolution Measurement of Ultra-Shallow Structures by Scanning Spreading Resistance Microscopy

Li Zhang、Kazuya Ohuchi、Kanna Adachi、Mitsuhiro Tomita、Kazunari Ishimaru、Mariko Takayanagi、Akira Nishiyama(1.Advanced LSI Technology Laboratory, Corporate Research & Development Center, Toshiba Corporation、2.Center For Semiconductor Research & Development, Toshiba Corporation Semiconductor Company)

[A-1-4]Imaging of interference between incident and reflected electron waves at an InAs/GaSb heterointerface by low-temperature scanning tunneling spectroscopy

K. Suzuki、K. Kanisawa、S. Perraud、M. Ueki、K. Takashina、Y. Hirayama(1.NTT Basic Research Laboratories, NTT Corporation、2.Laboratoire de Photonique et de Nanostructures, CNRS、3.NTT Electronics Techno Corporation、4.SORST-JST、5.Graduate School of Science、6.Tohoku University)

[A-2-3]Photon Statistics in a Thick Barrier Coupled Quantum Dot

Shohgo Yamauchi、Amane Shikanai、Isao Morohashi、Shigenori Furue、Kazuhiro Komori、Takeyoshi Sugaya、Toshihide Takagahara(1.National Institute of Advanced Industrial Science and Technology (AIST)、2.CREST, Japan Science and Technology Corporation (JST))

[A-2-6]Resonant Terahertz Detection Based on High-electron-mobility Transistor with Schottky Source/Drain Contact

Akira Satou、Victor Ryzhii、Taiichi Otsuji、Michael S. Shur(1.Computer Solid State Physics Laboratory, University of Aizu、2.Research Institute of Electrical Communication, Tohoku University、3.Department of Electrical, Computer, and Systems Engineering, Rensselaer Polytechnic Institute)

[A-6-3]Electric properties of single-walled carbon nanotube film field effect transistors with various work function electrodes: a comparison between pristine and potassium-encapsulated nanotubes

Hideyuki Maki、Satoru Suzuki、Tetsuya Sato、Koji Ishibashi(1.Department of Applied Physics and Physico-Informatics, Faculty of Science and Technology, Keio University、2.NTT Basic Research Laboratories, NTT Corporation、3.Advanced Device Laboratory, The Institute of Physical and Chemical Research (RIKEN))

[A-7-4]High-Density Floating Nanodots Memory Produced by Cage-Shaped Protein

Kiyohito Yamada、Shigeo Yoshii、Shinya Kumagai、Atsushi Miura、Yukiharu Uraoka、Takashi Fuyuki、Ichiro Yamashita(1.Advanced Technology Research Laboratories, Matsushita Electric Industrial Co., Ltd.、2.Graduate School of Materials Science, Nara Institute of Science and Technology、3.Core Research for Evolutional Science and Technology, Japan Science and Technology Agency)

[A-8-5]SET-based Flexible Multi-valued NAND and NOR Gates for Half-Adder

C. K. Lee、S. J. Kim、S. J. Choi、J. H. Hwang、R. S. Chung、J. J. Lee、M. S. Kim、S. J. Shin、J. B. Choi、Y. S. Yu、H. W. Kye、B. N. Song(1.Dept. of Physics & Institute for Nano Science & Technology, Chungbuk National University、2.Dept. of Information & Control Engineering, Hankyong National University、3.EXCEL Semiconductor Inc.)

[A-9-5]A Field-Effect Transistor with a Deposited Graphite Thin Film

Hiroshi Inokawa、Masao Nagase、Shigeru Hirono、Touichiro Goto、Hiroshi Yamaguchi、Keiichi Torimitsu(1.Research Institute of Electronics, Shizuoka University、2.NTT Basic Research Laboratories, NTT Corporation、3.NTT Afty Engineering Corporation)

[B-2-1]Integrated Photonic Network Node-Chip with Photonic Crystals

Hirohito Yamada、Tao Chu、Akiko Gomyo、Jun Ushida、Satomi Ishida、Yasuhiko Arakawa(1.NEC Corporation, Fundamental and Environmental Research Laboratories、2.Optoelectronic Industry and Technology Development Association、3.Univ. of Tokyo, Research Center for Advanced Science and Technology)

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