2006 International Conference on Solid State Devices and Materials
2006年9月12日〜9月15日PACIFICO Yokohama, Yokohama, Japan
2006 International Conference on Solid State Devices and Materials
2006年9月12日〜9月15日PACIFICO Yokohama, Yokohama, Japan
[A-8-4]Observation of single-electron pump operation with one ac gate bias in phosphorous-doped Si wires
D. Moraru、Y. Ono、H. Inokawa、K. Yokoi、R. Nuryadi、H. Ikeda、M. Tabe(1.Research Institute of Electronics, Shizuoka University、2.NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation.)
