2007 International Conference on Solid State Devices and Materials
2007年9月18日〜9月21日Tsukuba International Congress Center (EPOCHAL TSUKUBA), Ibaraki, Japan
2007 International Conference on Solid State Devices and Materials
2007年9月18日〜9月21日Tsukuba International Congress Center (EPOCHAL TSUKUBA), Ibaraki, Japan
[A-2-1]Evaluation of SiO2/GeO2/Ge MIS Interface Properties by Low Temperature Conductance Method
Hiroshi Matsubara、Hiroshi Kumagai、Satoshi Sugahara、Mitsuru Takenaka、Shin-ichi Takagi(1.Graduate School of Frontier Science, The University of Tokyo、2.Graduate School of Science and Technology, Tokyo Institute of Technology、3.School of Engineering, The University of Tokyo)
