[A-2-3]Experimental Evidence of Coexistence of Interface Traps Interacting with Majority and Minority Carriers in Ge MIS Structures
N. Taoka、Y. Yamashita、M. Harada、K. Ikeda、T. Yamamoto、N. Sugiyama、S. Takagi(1.MIRAI-ASRC、2.MIRAI-ASET、3.The University of Tokyo)
