2012 International Conference on Solid State Devices and Materials

2012 International Conference on Solid State Devices and Materials

2012年9月25日〜9月27日Kyoto International Conference Center, Kyoto, Japan
International Conference on Solid State Devices and Materials
2012 International Conference on Solid State Devices and Materials

2012 International Conference on Solid State Devices and Materials

2012年9月25日〜9月27日Kyoto International Conference Center, Kyoto, Japan

[B-2-3]Single-Poly Flash Memory with Degradation-Separated Scheme

H. W. H. Ching1、W. Robert1、Y. Kevin1、L. Yen Hsin1、B. Francis1、C. Hsin Ming1、Y. Evans1(1.eMemory Tech. Inc. , Taiwan)
https://doi.org/10.7567/SSDM.2012.B-2-3