International Conference on Solid State Devices and Materials

2016 International Conference on Solid State Devices and Materials

2016年9月26日〜9月29日Tsukuba International Congress Center, Tsukuba, Japan

International Conference on Solid State Devices and Materials

2016 International Conference on Solid State Devices and Materials

2016年9月26日〜9月29日Tsukuba International Congress Center, Tsukuba, Japan

[A-7-02]Drain-Bias Dependency on Statistical Variability for Tunnel Field-Effect Transistors

^○W. Y. Choi¹, S. H. Choi¹, J. W. Lee¹, I. Huh¹(1.Sogang Univ.(Korea))

https://doi.org/10.7567/SSDM.2016.A-7-02

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