2016 International Conference on Solid State Devices and Materials

2016 International Conference on Solid State Devices and Materials

2016年9月26日〜9月29日Tsukuba International Congress Center, Tsukuba, Japan
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International Conference on Solid State Devices and Materials
2016 International Conference on Solid State Devices and Materials

2016 International Conference on Solid State Devices and Materials

2016年9月26日〜9月29日Tsukuba International Congress Center, Tsukuba, Japan

[B-2-03]Highly Reliable MTJ-Based Nonvolatile Logic-in-Memory LSI with Content-Aware Write Error Masking Scheme

○M. Natsui1, A. Tamakoshi1, T. Endoh1, H. Ohno1, T. Hanyu1(1.Tohoku Univ.(Japan))
https://doi.org/10.7567/SSDM.2016.B-2-03
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