2016 International Conference on Solid State Devices and Materials

2016 International Conference on Solid State Devices and Materials

2016年9月26日〜9月29日Tsukuba International Congress Center, Tsukuba, Japan
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International Conference on Solid State Devices and Materials
2016 International Conference on Solid State Devices and Materials

2016 International Conference on Solid State Devices and Materials

2016年9月26日〜9月29日Tsukuba International Congress Center, Tsukuba, Japan

[B-2-05]Long-Term Reliable Physically Unclonable Function using Oxide Tunnel Barrier Breakdown on 2T-2MTJ Based Embedded-STT-MRAM

○S. Takaya1, T. Tanamoto1, H. Noguchi1, K. Ikegami1, K. Abe1, S. Fujita1(1.Toshiba Corp.(Japan))
https://doi.org/10.7567/SSDM.2016.B-2-05
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