2017 International Conference on Solid State Devices and Materials

2017 International Conference on Solid State Devices and Materials

2017年9月19日〜9月22日Sendai International Center
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International Conference on Solid State Devices and Materials
2017 International Conference on Solid State Devices and Materials

2017 International Conference on Solid State Devices and Materials

2017年9月19日〜9月22日Sendai International Center

[B-2-05]Crystal Structure Analyses of Organic Semiconductor Thin Films with Variable-Temperature Two-Dimensional Grazing Incidence X-ray Diffraction

○R. Abe1, H. Kojima1, M. Kikuchi2, T. Watanabe3, T. Koganezawa3, N. Yoshimoto2, I. Hirosawa3, M. Nakamura1(1.NAIST (Japan), 2.Iwate Univ. (Japan), 3.Japan Synchrotron Radiation Research Institute (Japan))
https://doi.org/10.7567/SSDM.2017.B-2-05
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