2019 International Conference on Solid State Devices and Materials

2019 International Conference on Solid State Devices and Materials

2019年9月2日〜9月5日Nagoya University
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International Conference on Solid State Devices and Materials
2019 International Conference on Solid State Devices and Materials

2019 International Conference on Solid State Devices and Materials

2019年9月2日〜9月5日Nagoya University

[A-6-04]Experimental study of bias stress degradation of organic thin film transistors

○K. Oshima1, M. Saito1, M. Shintani2, K. Kuribara3, Y. Ogasahara3, T. Sato1(1.Kyoto Univ. (Japan), 2.NAIST (Japan), 3.AIST (Japan))
https://doi.org/10.7567/SSDM.2019.A-6-04
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