2020 International Conference on Solid State Devices and Materials

2020 International Conference on Solid State Devices and Materials

2020年9月27日〜9月30日
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International Conference on Solid State Devices and Materials
2020 International Conference on Solid State Devices and Materials

2020 International Conference on Solid State Devices and Materials

2020年9月27日〜9月30日

[A-3-04]New Observation and Mechanism of Flicker Noise and Random Telegraph Noise in Sub-40nm SiC Strained nMOSFETs

〇Jyh-Chyurn Guo1, Adhi Cahyo Wijaya1, Jinq-Min Lin1(1. National Chiao-Tung University(Taiwan))
https://doi.org/10.7567/SSDM.2020.A-3-04
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