2020 International Conference on Solid State Devices and Materials

2020 International Conference on Solid State Devices and Materials

2020年9月27日〜9月30日
戻る
International Conference on Solid State Devices and Materials
2020 International Conference on Solid State Devices and Materials

2020 International Conference on Solid State Devices and Materials

2020年9月27日〜9月30日

[A-4-05]White Spots Caused by Junction Leakage in Small Pixels of CMOS Image Sensor

〇Jeongjin Cho1, Minji Jung1, Taesub Jung1, Masato Fujita1, Kyungho Lee1, Youjin Jung1, Sungmin Ahn1, Howoo Park2, Dukseo Park2, Younguk Song2, Takashi Nagano1, JungChak Ahn1, Yongin Park1(1. System LSI Division, Samsung Electronics Co., Ltd(Korea), 2. Foundry Division, Samsung Electronics Co., Ltd(Korea))
https://doi.org/10.7567/SSDM.2020.A-4-05
PDFダウンロードPDFダウンロード
戻る