2019 Annual Meeting
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Session Details

Planning LectureTechnical division and Network : Division of Radiation Technology

[2F_PL]Current status and future trends in electron microscopy

Thu. Mar 21, 2019 1:00 PM - 2:30 PM JST
Thu. Mar 21, 2019 4:00 AM - 5:30 AM UTC
Room F Common Education Bildg. 2 2F No.23
Chair:Hiroyuki Takahashi(Univ. of Tokyo)

[2F_PL01]Direct electromagnetic field imaging in materials by advanced atomic-resolution electron microscopy

*Naoya Shibata1 (1. Univ. of Tokyo)

[2F_PL02]Material characterization using scanning transmission electron microscopy and electron energy-loss spectroscopy

*Koji Kimoto 1 (1. NIMS)

[2F_PL03]Material Analyses by Electron Holography

*Toshiaki Tanigaki1 (1. Hitachi)
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