Presentation Information
[2M03]Performance test of a muon detector capable of charge identification using drift chambers
*Seiya Hirabayashi1, Satoko Kamei1, Akira Sato2, Shoichiro Kawase1, Yukinobu Watanabe1 (1. Kyushu Univ., 2. Osaka Univ.)
Keywords:
cosmic ray muons,soft errors in semiconductors,drift chamber,Angular distribution measurement
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