[Th-C3] Mass Spectrometry for Surface/Depth Analysis

12:20 PM - 12:50 PMINVITED

[Th-C3-04] Decoding Spintronic Material Interfaces using Gas Cluster SIMS at Cryogenic temperatures: High-Resolution Depth Profiling of Perovskite and OEL devices

*Naoko Sano¹, Kate McHardy¹, Paul Blenkinsopp¹ (1. Ionoptika Ltd. (UK))

Keywords:

Small size Gas Cluster Ion Beam,Cluster SIMS,Cryogenic temperatures,High resolution depth profiling,Perovskite devices,OEL devices