16th International Symposium on Atomic Level Characterizations for New Materials and Devices '26（ALC'26）
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Session Details

Advanced Technique

[Th-C3]Mass Spectrometry for Surface/Depth Analysis

Thu. Nov 5, 2026 11:00 AM - 12:50 PM
Room C (M105, 1st Floor)
Chair: Satoshi Ninomiya (University of Yamanashi), Shin-ichi Iida Iida (ULVAC-PHI, Inc.)
11:00 AM - 11:30 AMINVITED

[Th-C3-01]Toward Reliable Depth Analysis of Organic–Inorganic Multilayer Structures by TOF-SIMS

*Shin-ichi Iida1 (1. ULVAC-PHI, Inc. (Japan))
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11:30 AM - 12:00 PMINVITED

[Th-C3-02]Elastic Modulus Measurement of Ultra-Thin Films and Lubricant Layers Using Ar Gas Cluster Ion Beams and Its Application to Tribology

*Hiroshi Tani1 (1. Kansai University (Japan))
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12:00 PM - 12:20 PM

[Th-C3-03]Development of Resonant Laser Secondary Neutral Mass Spectrometry
for Isotopic Micro-Imaging of Fuel Debris from Fukushima Daiichi Nuclear Power Station

*Daisuke Ishikura1,2, Takeru Yoshida2,3, Koji Maeda2, Tetsuo Sakamoto3,2, Hideki Tomita1,2 (1. Nagoya Univ. (Japan), 2. JAEA (Japan), 3. Kogakuin Univ. (Japan))
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12:20 PM - 12:50 PMINVITED

[Th-C3-04]Decoding Spintronic Material Interfaces using Gas Cluster SIMS at Cryogenic temperatures: High-Resolution Depth Profiling of Perovskite and OEL devices

*Naoko Sano1, Kate McHardy1, Paul Blenkinsopp1 (1. Ionoptika Ltd. (UK))
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