Session Details
[We-B6]Novel Electron Microscopy Techniques & Structure Analysis
Wed. Nov 4, 2026 5:30 PM - 6:40 PM
Room B (M103, 1st Floor)
Chair: Shin-ichiro Sato (National Institutes for Quantum Science and Technology), Kazuhito Tsukagoshi (NIMS)
[We-B6-01]Precise Measurements of Axial Brightness of Electron Emitters
*Jun Yamasaki1,2, Shuhei Hatanaka1 (1. The University of Osaka (Japan), 2. Nagoya University (Japan))
[We-B6-02]Quantitative Analysis of Resolution Degradation in STEM Images Caused by Multiple Scattering
*Qianyi Geng1, Kazuhisa Sato2,3, Jun Yamasaki3,4 (1. Department of Quantum Information Electronics, The University of Osaka (Japan), 2. Faculty of Engineering, Kyushu University (Japan), 3. Research Center for UHVEM, The University of Osaka (Japan), 4. Institute of Materials and Systems for Sustainability, Nagoya Nniversity (Japan))
[We-B6-03]Mesoscopic States of Dissolved Gases in Water: TEM Observations
*Ing-Shouh Hwang1, Wei-Hao Hsu1, Ching-Hsiu Chen1, Ryoko Oishi-Tomiyasu2, Chi-Cheng Lee3, Ming-Wen Chu4 (1. Institute of Physics, Academia Sinica (Taiwan), 2. Institute of Mathematics for Industry, Kyushu University, (Japan), 3. Department of Physics, Tamkang University (Taiwan), 4. Center for Condensed Matter Sciences, National Taiwan University (Taiwan))