[1P501-34] 5. Dispersion and Aggregation

[P5-30] AFM Study of Non-DLVO Repulsion Between Silica Surfaces in High-Concentration Aqueous Electrolyte Solutions

*Ryoto Otsubo¹, Naoyuki Ishida¹ (1. Graduate School of Science and Engineerimg, Doshisha University (Japan))

Keywords:

Underscreening,Atomic Force Microscope (AFM),Interaction force,High concentration electrolyte